AMB Ceramic Substrate Defect Inspection

                                                                       


Application

This equipment is a high-precision offline ceramic substrate inspection equipment, which can detect ceramic substrates with a size of 140mm*190mm. This equipment is composed of feeding machine, testing machine, unloading machine and double-check workstation. It can inspect defects such as solder residue, open and short circuit, dry film residue, copper leakage, bubbles, solder mask on the pad, and groove overflow.

Application area

Suitable for the production and quality control of AMB ceramic substrate with high quality requirements. 

Features

1. Combination of multiple high-resolution optical systems.

2. Lighting design with a variety of LED line light sources.

3. Available with several kinds of marking methods to identify the defect location.

4. Multi-station detection reduces the omission ratio.

5. Adaptable to certain level of board warp.

6. Data storage function for quality evaluation and process optimization.

7. Recheck workstation.  

Technical Parameter

Technical Parameter
Dimensions6050×2750×1800mm
Weight2000kg
Power supplySingle-phase 3 wire AC220V±10%
Air supply6~8kgf/cm²
Temperature/humidity17~35℃/RH<70%
PowerRated 10KW/ Actual 7KW
LanguageEnglish
CCD PixelAOI 1:13um/Pixel   AOI 2/3:24um/Pixel


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