DCB Ceramic Substrate Defect Detection E

                                                                       


Application

This AOI equipment is a high-precision offline defect detection equipment for ceramic substrate,  which can inspect a size of 140mm×190mm. It can be used to check defects such as chipped ceramic edges, copper oxidation, open circuit,over corrosion, dint, scratches, surface copper deficiency, dimple, wrinkles, pimple, cutting dislocation,  poor plating, poor resistance welding and other defects.

Application area

Suitable for the production and quality control of ceramic substrates with high quality requirements.

设备特点

1. Combination of multiple high-resolution optical systems.

2. Lighting design with a variety of LED line light sources.

3. Available with several kinds of marking methods to identify the defect location.

4. Multi-station detection reduces the omission ratio.

5. Adaptable to certain level of board warp.

6. Data storage function for quality evaluation and process optimization. 

Technical Parameter

Technical Parameter
DimensionsL1930mm×W1430mm×H1900mm
Weight1500kg
Power supplySingle-phase 3 wire AC220V±10%
Air supply6~8kgf/cm²
Temperature/humidity17~35℃/RH<70%
PowerRated 10kW / Actual 7KW
LanguageEnglish
CCD PixelAOI1:13um/Pixel AOI2/3:24um/Pixel


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